Carrier Concentration vs. Resistivity (Si, Ge)
Calculates carrier concentration (atoms per cubic cm) and resistivity (Ω-cm)
Crystal Planes in Semiconductors – Miller Index
Crystal lattice planes can be characterized by a three digit number called a Miller Index.
Diamond Cubic – Visualization Software
This software helps visualize Silicon’s diamond cubic unit cell structure
Wikipedia article about the element Silicon
Die Per Wafer Calculator
Uses inputs such as wafer diameter, die size, die spacing, and edge exclusion to calculate the total number of whole die per wafer
Wafer Orientation vs. Wafer Flats
One or two flats ground into the edge of the wafer indicate crystal orientation, and generally applies to wafers 125mm in diameter or smaller
Standard Wafer Thickness
This chart shows the SEMI standard wafer thickness associated with each wafer diameter.
Uses variables, such as time, temperature, desired thickness, and ambient conditions to calculate outcomes for thermal oxides
Silicon Dioxide Thickness – Color Chart
Silicon dioxide film thickness can be determined visually by film color, especially if the number of fringe lines is known.
Silicon Nitride Thickness – Color Chart
Silicon nitride film thickness can be determined visually by film color, especially if the number of fringe lines is known.
The RCA clean is a widely used method to remove organic and metallic residues.
Convert units of measure for almost anything, including science, engineering, industry, and business.
Definitions for Integrated Circuit and Semiconductor terminology
Uses number tested, number failed, and confidence level to calculate Lot
Tolerance Percent Defective (LTPD), which represents buyer’s risk